Measuring the lateral charge-carrier mobility in metal-insulator-semiconductor capacitors via Kelvin-probe
We report a Kelvin-probe method to investigate the lateral charge-transport properties of semiconductors, most notably the charge-carrier mobility. The method is based on successive charging and discharging of a pre-biased metal-insulator-semiconductor stack by an alternating voltage applied to one...
Gespeichert in:
| Hauptverfasser: | , , , |
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| Dokumenttyp: | Article (Journal) |
| Sprache: | Englisch |
| Veröffentlicht: |
4 January 2018
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| In: |
Review of scientific instruments
Year: 2018, Jahrgang: 89, Heft: 1 |
| ISSN: | 1089-7623 |
| DOI: | 10.1063/1.5002629 |
| Online-Zugang: | Verlag, lizenzpflichtig, Volltext: https://doi.org/10.1063/1.5002629 Verlag, lizenzpflichtig, Volltext: https://aip.scitation.org/doi/10.1063/1.5002629 
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| Verfasserangaben: | Valeria Milotti, Manuel Pietsch, Karl-Philipp Strunk, and Christian Melzer |
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| LEADER | 00000caa a2200000 c 4500 | ||
|---|---|---|---|
| 001 | 169500731X | ||
| 003 | DE-627 | ||
| 005 | 20220818044732.0 | ||
| 007 | cr uuu---uuuuu | ||
| 008 | 200420s2018 xx |||||o 00| ||eng c | ||
| 024 | 7 | |a 10.1063/1.5002629 |2 doi | |
| 035 | |a (DE-627)169500731X | ||
| 035 | |a (DE-599)KXP169500731X | ||
| 035 | |a (OCoLC)1341315654 | ||
| 040 | |a DE-627 |b ger |c DE-627 |e rda | ||
| 041 | |a eng | ||
| 084 | |a 29 |2 sdnb | ||
| 100 | 1 | |a Milotti, Valeria |e VerfasserIn |0 (DE-588)1208663674 |0 (DE-627)1695015207 |4 aut | |
| 245 | 1 | 0 | |a Measuring the lateral charge-carrier mobility in metal-insulator-semiconductor capacitors via Kelvin-probe |c Valeria Milotti, Manuel Pietsch, Karl-Philipp Strunk, and Christian Melzer |
| 264 | 1 | |c 4 January 2018 | |
| 300 | |a 7 | ||
| 336 | |a Text |b txt |2 rdacontent | ||
| 337 | |a Computermedien |b c |2 rdamedia | ||
| 338 | |a Online-Ressource |b cr |2 rdacarrier | ||
| 500 | |a Gesehen am 20.04.2020 | ||
| 520 | |a We report a Kelvin-probe method to investigate the lateral charge-transport properties of semiconductors, most notably the charge-carrier mobility. The method is based on successive charging and discharging of a pre-biased metal-insulator-semiconductor stack by an alternating voltage applied to one edge of a laterally confined semiconductor layer. The charge carriers spreading along the insulator-semiconductor interface are directly measured by a Kelvin-probe, following the time evolution of the surface potential. A model is presented, describing the device response for arbitrary applied biases allowing the extraction of the lateral charge-carrier mobility from experimentally measured surface potentials. The method is tested using the organic semiconductor poly(3-hexylthiophene), and the extracted mobilities are validated through current voltage measurements on respective field-effect transistors. Our widely applicable approach enables robust measurements of the lateral charge-carrier mobility in semiconductors with weak impact from the utilized contact materials. | ||
| 700 | 1 | |a Pietsch, Manuel |e VerfasserIn |0 (DE-588)1198435674 |0 (DE-627)1680809598 |4 aut | |
| 700 | 1 | |a Strunk, Karl-Philipp |d 1989- |e VerfasserIn |0 (DE-588)1181137071 |0 (DE-627)1662635281 |4 aut | |
| 700 | 1 | |a Melzer, Christian |d 1970- |e VerfasserIn |0 (DE-588)173722237 |0 (DE-627)698628322 |0 (DE-576)134563379 |4 aut | |
| 773 | 0 | 8 | |i Enthalten in |t Review of scientific instruments |d [Melville, NY] : AIP Publishing, 1930 |g 89(2018,1) Artikel-Nummer 013902, 7 Seiten |h Online-Ressource |w (DE-627)268759324 |w (DE-600)1472905-2 |w (DE-576)077609948 |x 1089-7623 |7 nnas |a Measuring the lateral charge-carrier mobility in metal-insulator-semiconductor capacitors via Kelvin-probe |
| 773 | 1 | 8 | |g volume:89 |g year:2018 |g number:1 |g extent:7 |a Measuring the lateral charge-carrier mobility in metal-insulator-semiconductor capacitors via Kelvin-probe |
| 856 | 4 | 0 | |u https://doi.org/10.1063/1.5002629 |x Verlag |x Resolving-System |z lizenzpflichtig |3 Volltext |
| 856 | 4 | 0 | |u https://aip.scitation.org/doi/10.1063/1.5002629 |x Verlag |z lizenzpflichtig |3 Volltext |
| 951 | |a AR | ||
| 992 | |a 20200420 | ||
| 993 | |a Article | ||
| 994 | |a 2018 | ||
| 998 | |g 173722237 |a Melzer, Christian |m 173722237:Melzer, Christian |d 130000 |d 130700 |e 130000PM173722237 |e 130700PM173722237 |k 0/130000/ |k 1/130000/130700/ |p 4 |y j | ||
| 998 | |g 1181137071 |a Strunk, Karl-Philipp |m 1181137071:Strunk, Karl-Philipp |d 130000 |d 130700 |e 130000PS1181137071 |e 130700PS1181137071 |k 0/130000/ |k 1/130000/130700/ |p 2 | ||
| 999 | |a KXP-PPN169500731X |e 3627501632 | ||
| BIB | |a Y | ||
| SER | |a journal | ||
| JSO | |a {"person":[{"family":"Milotti","given":"Valeria","roleDisplay":"VerfasserIn","display":"Milotti, Valeria","role":"aut"},{"role":"aut","display":"Pietsch, Manuel","roleDisplay":"VerfasserIn","given":"Manuel","family":"Pietsch"},{"given":"Karl-Philipp","family":"Strunk","role":"aut","display":"Strunk, Karl-Philipp","roleDisplay":"VerfasserIn"},{"display":"Melzer, Christian","roleDisplay":"VerfasserIn","role":"aut","family":"Melzer","given":"Christian"}],"title":[{"title":"Measuring the lateral charge-carrier mobility in metal-insulator-semiconductor capacitors via Kelvin-probe","title_sort":"Measuring the lateral charge-carrier mobility in metal-insulator-semiconductor capacitors via Kelvin-probe"}],"language":["eng"],"recId":"169500731X","note":["Gesehen am 20.04.2020"],"type":{"bibl":"article-journal","media":"Online-Ressource"},"name":{"displayForm":["Valeria Milotti, Manuel Pietsch, Karl-Philipp Strunk, and Christian Melzer"]},"id":{"eki":["169500731X"],"doi":["10.1063/1.5002629"]},"origin":[{"dateIssuedKey":"2018","dateIssuedDisp":"4 January 2018"}],"relHost":[{"name":{"displayForm":["publ. by the American Institute of Physics"]},"id":{"eki":["268759324"],"zdb":["1472905-2"],"issn":["1089-7623"]},"origin":[{"dateIssuedDisp":"2013-","publisher":"AIP Publishing ; American Institute of Physics","dateIssuedKey":"2013","publisherPlace":"[Melville, NY] ; [Woodbury, Long Island, NY]"}],"physDesc":[{"extent":"Online-Ressource"}],"title":[{"title":"Review of scientific instruments","subtitle":"a monthly journal devoted to scientific instruments, apparatus, and techniques","title_sort":"Review of scientific instruments"}],"language":["eng"],"corporate":[{"roleDisplay":"Herausgebendes Organ","display":"American Institute of Physics","role":"isb"}],"recId":"268759324","note":["Gesehen am 12.07.24"],"disp":"Measuring the lateral charge-carrier mobility in metal-insulator-semiconductor capacitors via Kelvin-probeReview of scientific instruments","type":{"media":"Online-Ressource","bibl":"periodical"},"part":{"year":"2018","issue":"1","text":"89(2018,1) Artikel-Nummer 013902, 7 Seiten","volume":"89","extent":"7"},"pubHistory":["1.1930 -"]}],"physDesc":[{"extent":"7 S."}]} | ||
| SRT | |a MILOTTIVALMEASURINGT4201 | ||