Understanding chemical versus electrostatic shifts in X-ray photoelectron spectra of organic self-assembled monolayers

The focus of the present article is on understanding the insight that X-ray photoelectron spectroscopy (XPS) measurements can provide when studying self-assembled monolayers. Comparing density functional theory calculations to experimental data on deliberately chosen model systems, we show that both...

Full description

Saved in:
Bibliographic Details
Main Authors: Taucher, Thomas C. (Author) , Hehn, Iris (Author) , Hofmann, Oliver T. (Author) , Zharnikov, Michael (Author) , Zojer, Egbert (Author)
Format: Article (Journal)
Language:English
Published: January 25, 2016
In: The journal of physical chemistry. C, Energy, materials, and catalysis
Year: 2016, Volume: 120, Issue: 6, Pages: 3428-3437
ISSN:1932-7455
DOI:10.1021/acs.jpcc.5b12387
Online Access:Verlag, lizenzpflichtig, Volltext: https://doi.org/10.1021/acs.jpcc.5b12387
Get full text
Author Notes:Thomas C. Taucher, Iris Hehn, Oliver T. Hofmann, Michael Zharnikov, and Egbert Zojer
Description
Summary:The focus of the present article is on understanding the insight that X-ray photoelectron spectroscopy (XPS) measurements can provide when studying self-assembled monolayers. Comparing density functional theory calculations to experimental data on deliberately chosen model systems, we show that both the chemical environment and electrostatic effects arising from a superposition of molecular dipoles influence the measured core-level binding energies to a significant degree. The crucial role of the often overlooked electrostatic effects in polar self-assembled monolayers (SAMs) is unambiguously demonstrated by changing the dipole density through varying the SAM coverage. As a consequence of this effect, care has to be taken when extracting chemical information from the XP spectra of ordered organic adsorbate layers. Our results, furthermore, imply that XPS is a powerful tool for probing local variations in the electrostatic energy in nanoscopic systems, especially in SAMs.
Item Description:Gesehen am 20.05.2020
Physical Description:Online Resource
ISSN:1932-7455
DOI:10.1021/acs.jpcc.5b12387