Electric transport properties of surface-anchored metal-organic frameworks and the effect of ferrocene loading
Understanding of the electric transport through surface-anchored metal-organic frameworks (SURMOFs) is important both from a fundamental perspective as well as with regards to possible future applications in electronic devices. To address this mostly unexplored subject, we integrated a series of rep...
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| Hauptverfasser: | , , , , , , , , |
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| Dokumenttyp: | Article (Journal) |
| Sprache: | Englisch |
| Veröffentlicht: |
April 15, 2015
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| In: |
ACS applied materials & interfaces
Year: 2015, Jahrgang: 7, Heft: 18, Pages: 9824-9830 |
| ISSN: | 1944-8252 |
| DOI: | 10.1021/acsami.5b01792 |
| Online-Zugang: | Resolving-System, lizenzpflichtig, Volltext: https://doi.org/10.1021/acsami.5b01792 Verlag, lizenzpflichtig, Volltext: https://pubs.acs.org/doi/10.1021/acsami.5b01792 
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| Verfasserangaben: | Jianxi Liu, Tobias Wächter, Andreas Irmler, Peter G. Weidler, Hartmut Gliemann, Fabian Pauly, Veronica Mugnaini, Michael Zharnikov, and Christof Wöll |
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| 520 | |a Understanding of the electric transport through surface-anchored metal-organic frameworks (SURMOFs) is important both from a fundamental perspective as well as with regards to possible future applications in electronic devices. To address this mostly unexplored subject, we integrated a series of representative SURMOF thin films, formed by copper nodes and trimesic acid and known as HKUST-1, in a mercury-drop-based tunneling junction. Although the transport properties of these SURMOFs are analogous to those of hybrid metal-organic molecular wires, manifested by a very low value of the tunneling decay constant (β ≈ 0.006 Å-1), they are at the same time found to be consistent with a linear increase of resistance with film thickness. Upon loading of SURMOF pores with ferrocene (Fc), a noticeable increase in transport current was observed. A transport model and ab initio electronic structure calculations were used to reveal a hopping transport mechanism and to relate the changes upon Fc loading to those of the electronic and vibrational structures of the SURMOF films. | ||
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