Multiple Coulomb scattering in thin silicon
We present a measurement of multiple Coulomb scattering of 1 to 6 GeV/c electrons in thin (50-140 μm) silicon targets. The data were obtained with the EUDET telescope Aconite at DESY and are compared to parametrisations as used in the Geant4 software package. We find good agreement between data and...
Gespeichert in:
| Hauptverfasser: | , , , , , |
|---|---|
| Dokumenttyp: | Article (Journal) |
| Sprache: | Englisch |
| Veröffentlicht: |
4 July 2014
|
| In: |
Journal of Instrumentation
Year: 2014, Jahrgang: 9, Heft: 07, Pages: ? |
| ISSN: | 1748-0221 |
| DOI: | 10.1088/1748-0221/9/07/P07007 |
| Online-Zugang: | Verlag, lizenzpflichtig, Volltext: https://doi.org/10.1088/1748-0221/9/07/P07007
|
| Verfasserangaben: | N. Berger, A. Buniatyan, P. Eckert, F. Förster, R. Gredig, O. Kovalenko, M. Kiehn, R. Philipp, A. Schöning and D. Wiedner |
| Zusammenfassung: | We present a measurement of multiple Coulomb scattering of 1 to 6 GeV/c electrons in thin (50-140 μm) silicon targets. The data were obtained with the EUDET telescope Aconite at DESY and are compared to parametrisations as used in the Geant4 software package. We find good agreement between data and simulation in the scattering distribution width but large deviations in the shape of the distribution. In order to achieve a better description of the shape, a new scattering model based on a Student's t distribution is developed and compared to the data. |
|---|---|
| Beschreibung: | Gesehen am 11.08.2020 |
| Beschreibung: | Online Resource |
| ISSN: | 1748-0221 |
| DOI: | 10.1088/1748-0221/9/07/P07007 |