Mapping impurity of single-walled carbon nanotubes in bulk samples with multiplex coherent anti-Stokes Raman microscopy

Mapping of defects in bulk samples of single-walled carbon nanotubes (SWNT) is performed via multiplex coherent anti-Stokes Raman microscopy. The D and G vibrational bands are acquired simultaneously, and their relative amplitude is used as a criterion to quantify the local purity in spin-coated SWN...

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Bibliographic Details
Main Authors: Duarte, Alex S. (Author) , Rehbinder, Jean (Author) , Correia, Ricardo R. B. (Author) , Buckup, Tiago (Author) , Motzkus, Marcus (Author)
Format: Article (Journal)
Language:English
Published: January 16, 2013
In: Nano letters
Year: 2013, Volume: 13, Issue: 2, Pages: 697-702
ISSN:1530-6992
DOI:10.1021/nl304371x
Online Access:Verlag, lizenzpflichtig, Volltext: https://doi.org/10.1021/nl304371x
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Author Notes:Alex S. Duarte, Jean Rehbinder, Ricardo R.B. Correia, Tiago Buckup, and Marcus Motzkus
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Summary:Mapping of defects in bulk samples of single-walled carbon nanotubes (SWNT) is performed via multiplex coherent anti-Stokes Raman microscopy. The D and G vibrational bands are acquired simultaneously, and their relative amplitude is used as a criterion to quantify the local purity in spin-coated SWNT samples. We observe that defects induced by oxidation are related to the spatial dispersion of nanotubes in a solid distribution.
Item Description:Gesehen am 05.01.2021
Physical Description:Online Resource
ISSN:1530-6992
DOI:10.1021/nl304371x