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High-precision semiconductor wavelength sensor based on a double-layer photo diode

We present a wavelength sensor setup for monochromatic visible light, based on the double-layer photo diode WS-7.56. Employing high-precision electronics and automatic compensation of different error sources, we achieve a measurement accuracy of ±0.025 nm with a resolution below 0.01 nm. The describ...

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Hauptverfasser: Amthor, Thomas (VerfasserIn) , Hofmann, Christoph S. (VerfasserIn) , Knorz, Jürgen (VerfasserIn) , Weidemüller, Matthias (VerfasserIn)
Dokumenttyp: Article (Journal)
Sprache:Englisch
Veröffentlicht: 29 September 2011
In: Review of scientific instruments
Year: 2011, Jahrgang: 82, Heft: 9, Pages: 1-6
ISSN:1089-7623
DOI:10.1063/1.3640409
Online-Zugang:Verlag, lizenzpflichtig, Volltext: https://doi.org/10.1063/1.3640409
Verlag, lizenzpflichtig, Volltext: https://aip.scitation.org/doi/10.1063/1.3640409
Volltext
Verfasserangaben:Thomas Amthor, Christoph S. Hofmann, Jürgen Knorz, and Matthias Weidemüller
Beschreibung
Zusammenfassung:We present a wavelength sensor setup for monochromatic visible light, based on the double-layer photo diode WS-7.56. Employing high-precision electronics and automatic compensation of different error sources, we achieve a measurement accuracy of ±0.025 nm with a resolution below 0.01 nm. The described apparatus is particularly suited for the determination of small laser frequency deviations in atomic physics experiments. Various design issues as well as error sources and diode characteristics are discussed.
Beschreibung:Gesehen am 02.03.2022
Beschreibung:Online Resource
ISSN:1089-7623
DOI:10.1063/1.3640409

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