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High-precision semiconductor wavelength sensor based on a double-layer photo diode

We present a wavelength sensor setup for monochromatic visible light, based on the double-layer photo diode WS-7.56. Employing high-precision electronics and automatic compensation of different error sources, we achieve a measurement accuracy of ±0.025 nm with a resolution below 0.01 nm. The describ...

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Hauptverfasser: Amthor, Thomas (VerfasserIn) , Hofmann, Christoph S. (VerfasserIn) , Knorz, Jürgen (VerfasserIn) , Weidemüller, Matthias (VerfasserIn)
Dokumenttyp: Article (Journal)
Sprache:Englisch
Veröffentlicht: 29 September 2011
In: Review of scientific instruments
Year: 2011, Jahrgang: 82, Heft: 9, Pages: 1-6
ISSN:1089-7623
DOI:10.1063/1.3640409
Online-Zugang:Verlag, lizenzpflichtig, Volltext: https://doi.org/10.1063/1.3640409
Verlag, lizenzpflichtig, Volltext: https://aip.scitation.org/doi/10.1063/1.3640409
Volltext
Verfasserangaben:Thomas Amthor, Christoph S. Hofmann, Jürgen Knorz, and Matthias Weidemüller

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