Enhancement of photodetector responsivity in standard SOI CMOS processes by introducing resonant grating structures

A new photodetector concept is described which is fully compatible with the standard SOI CMOS process and does not require any post-processing steps. Our simulations are based on two-dimensional RCWA (Rigorous Coupled Wave Analysis) and local absorption theory (K.-H.Brenner, "Aspects for calcul...

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Hauptverfasser: Auer, Maximilian (VerfasserIn) , Brenner, Karl-Heinz (VerfasserIn)
Dokumenttyp: Article (Journal)
Sprache:Englisch
Veröffentlicht: 2011
In: Journal of the European Optical Society. Rapid publications
Year: 2011, Jahrgang: 6, Pages: 1-5
ISSN:1990-2573
DOI:10.2971/jeos.2011.11014s
Online-Zugang:Verlag, lizenzpflichtig, Volltext: https://doi.org/10.2971/jeos.2011.11014s
Verlag, lizenzpflichtig, Volltext: https://www.jeos.org/index.php/jeos_rp/article/view/11014s
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Verfasserangaben:M. Auer, K.-H. Brenner
Beschreibung
Zusammenfassung:A new photodetector concept is described which is fully compatible with the standard SOI CMOS process and does not require any post-processing steps. Our simulations are based on two-dimensional RCWA (Rigorous Coupled Wave Analysis) and local absorption theory (K.-H.Brenner, "Aspects for calculating local absorption with the rigorous coupled-wave method" Optic Express 2010, accepted). The simulations show that optimized lateral grating structures are able to enhance the absorption efficiency of thin semi-conductor detectors by a factor of 32 compared to nonenhanced approaches.
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Beschreibung:Online Resource
ISSN:1990-2573
DOI:10.2971/jeos.2011.11014s