Object-wave reconstruction by carbon film-based Zernike- and Hilbert-phase plate microscopy: A theoretical study not restricted to weak-phase objects

Transmission electron microscopy phase-contrast images taken by amorphous carbon film-based phase plates are affected by the scattering of electrons within the carbon film causing a modification of the image-wave function. Moreover, image artefacts are produced by non-centrosymmetric phase plate des...

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Main Authors: Dries, Manuel Rainer (Author) , Schultheiss, K. (Author) , Gamm, B. (Author) , Rosenauer, A. (Author) , Schröder, Rasmus R. (Author) , Gerthsen, D. (Author)
Format: Article (Journal)
Language:English
Published: 2011
In: Ultramicroscopy
Year: 2011, Volume: 111, Issue: 2, Pages: 159-168
ISSN:1879-2723
DOI:10.1016/j.ultramic.2010.10.009
Online Access:Verlag, lizenzpflichtig, Volltext: https://doi.org/10.1016/j.ultramic.2010.10.009
Verlag, lizenzpflichtig, Volltext: https://www.sciencedirect.com/science/article/pii/S0304399110002639
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Author Notes:M. Dries, K. Schultheiss, B. Gamm, A. Rosenauer, R.R. Schröder, D. Gerthsen
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Summary:Transmission electron microscopy phase-contrast images taken by amorphous carbon film-based phase plates are affected by the scattering of electrons within the carbon film causing a modification of the image-wave function. Moreover, image artefacts are produced by non-centrosymmetric phase plate designs such as the Hilbert-phase plate. Various methods are presented to correct phase-contrast images with respect to the scattering of electrons and image artefacts induced by phase plates. The proposed techniques are not restricted to weak-phase objects and linear image formation. Phase-contrast images corrected by the presented methods correspond to those taken by an ideal centrosymmetric, matter-free phase plate and are suitable for object-wave reconstruction.
Item Description:Available online 20 October 2010
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Physical Description:Online Resource
ISSN:1879-2723
DOI:10.1016/j.ultramic.2010.10.009