Dewetting dynamics of stressed viscoelastic thin polymer films

Ultrathin polymer films that are produced, e.g., by spin coating are believed to be stressed since polymers are “frozen in” into out-of-equilibrium configurations during this process. In the framework of a viscoelastic thin-film model, we study the effects of lateral residual stresses on the dewetti...

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Bibliographic Details
Main Authors: Ziebert, Falko (Author) , Raphaël, Elie (Author)
Format: Article (Journal)
Language:English
Published: 13 March 2009
In: Physical review. E, Statistical, nonlinear, and soft matter physics
Year: 2009, Volume: 79, Issue: 3, Pages: 1-10
ISSN:1550-2376
DOI:10.1103/PhysRevE.79.031605
Online Access:Verlag, lizenzpflichtig, Volltext: https://doi.org/10.1103/PhysRevE.79.031605
Verlag, lizenzpflichtig, Volltext: https://link.aps.org/doi/10.1103/PhysRevE.79.031605
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Author Notes:Falko Ziebert and Elie Raphaël
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Summary:Ultrathin polymer films that are produced, e.g., by spin coating are believed to be stressed since polymers are “frozen in” into out-of-equilibrium configurations during this process. In the framework of a viscoelastic thin-film model, we study the effects of lateral residual stresses on the dewetting dynamics of the film. The temporal evolution of the height profiles and the velocity profiles inside the film as well as the dissipation mechanisms are investigated in detail. Both the shape of the profiles and the importance of frictional dissipation vs viscous dissipation inside the film are found to change in the course of dewetting. The interplay of the nonstationary profiles, the relaxing initial stress, and the changes in the dominance of the two dissipation mechanisms caused by nonlinear friction with the substrate is responsible for the rich behavior of the system. In particular, our analysis sheds a different light on the occurrence of the unexpected maximum in the rim width obtained recently in experiments on polystyrene-polydimethylsiloxane systems.
Item Description:Gesehen am 23.09.2022
Physical Description:Online Resource
ISSN:1550-2376
DOI:10.1103/PhysRevE.79.031605