Particle pixel detectors in high-voltage CMOS technology: new achievements

Particle pixel detectors in standard high-voltage CMOS technology are a new detector family that allows implementation of low-cost radiation-tolerant detectors with good time resolution. In order to test the concept we have implemented three detector variants. The first variant uses simple four-tran...

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Bibliographic Details
Main Authors: Peric, Ivan (Author) , Kreidl, Christian (Author) , Fischer, Peter (Author)
Format: Article (Journal)
Language:English
Published: 2011
In: Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment
Year: 2011, Volume: 650, Issue: 1, Pages: 158-162
ISSN:1872-9576
DOI:10.1016/j.nima.2010.11.090
Online Access:Verlag, lizenzpflichtig, Volltext: https://doi.org/10.1016/j.nima.2010.11.090
Verlag, lizenzpflichtig, Volltext: https://www.sciencedirect.com/science/article/pii/S0168900210026252
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Author Notes:I. Perić, C. Kreidl, P. Fischer
Description
Summary:Particle pixel detectors in standard high-voltage CMOS technology are a new detector family that allows implementation of low-cost radiation-tolerant detectors with good time resolution. In order to test the concept we have implemented three detector variants. The first variant uses simple four-transistor pixel electronics that allows the rolling-shutter readout. The second variant implements complex CMOS pixel electronics with particle hit detection on pixel level and binary readout. The third variant uses the readout based on the capacitive chip-to-chip signal transmission. In this paper we will present the recent experimental results.
Item Description:Available online 23 November 2010
Gesehen am 24.10.2022
Physical Description:Online Resource
ISSN:1872-9576
DOI:10.1016/j.nima.2010.11.090