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Visualizing the active paths in morphologically defective organic thin-film transistors

The charge-carrier mobility of organic semiconductors extracted from thin-film transistors is highly dependent on film morphology. Morphological defects can lead to the underestimation of charge transport properties, which may impede the rational design of novel materials. Herein, a novel analytical...

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Hauptverfasser: Zhang, Wen-Shan (VerfasserIn) , Matthiesen, Maik (VerfasserIn) , Günther, Benjamin (VerfasserIn) , Wensorra, Jakob (VerfasserIn) , Fischer, Daniel (VerfasserIn) , Gade, Lutz H. (VerfasserIn) , Zaumseil, Jana (VerfasserIn) , Schröder, Rasmus R. (VerfasserIn)
Dokumenttyp: Article (Journal)
Sprache:Englisch
Veröffentlicht: August 25, 2021
In: Advanced electronic materials
Year: 2021, Jahrgang: 7, Heft: 11, Pages: 1-10
ISSN:2199-160X
DOI:10.1002/aelm.202100400
Online-Zugang:Verlag, kostenfrei, Volltext: https://doi.org/10.1002/aelm.202100400
Verlag, kostenfrei, Volltext: https://onlinelibrary.wiley.com/doi/abs/10.1002/aelm.202100400
Volltext
Verfasserangaben:Wen-Shan Zhang, Maik Matthiesen, Benjamin Günther, Jakob Wensorra, Daniel Fischer, Lutz H. Gade, Jana Zaumseil, and Rasmus R. Schröder
Beschreibung
Zusammenfassung:The charge-carrier mobility of organic semiconductors extracted from thin-film transistors is highly dependent on film morphology. Morphological defects can lead to the underestimation of charge transport properties, which may impede the rational design of novel materials. Herein, a novel analytical method is presented to functionally characterize entire active layers of solution-processed thin-film transistors. By correlating imaging and spectroscopy of secondary electrons, nano-sized morphological defects are discovered and the effective current paths between source and drain electrodes are directly visualized. After image-processing, the as-measured mobility values of zone-cast thin-films of a tetraazaperopyrene derivative are corrected, obtaining charge-carrier mobilities of up to five times higher than the as-measured values. The direct visualization of the electric functionality of the organic thin-films facilitates a unique quantification of the impact of morphological defects and provides a solid benchmark to estimate the potential for further improvement of device performance.
Beschreibung:Gesehen am 27.03.2023
Beschreibung:Online Resource
ISSN:2199-160X
DOI:10.1002/aelm.202100400

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