Low-energy calibration of XENON1T with an internal 37 Ar source
A low-energy electronic recoil calibration of XENON1T, a dual-phase xenon time projection chamber, with an internal 37 Ar source was performed. This calibration source features a 35-day half-life and provides two monoenergetic lines at 2.82 keV and 0.27 keV. The photon yield and electron yield at 2....
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| Main Authors: | , , , |
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| Format: | Article (Journal) |
| Language: | English |
| Published: |
27 June 2023
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| In: |
The European physical journal. C, Particles and fields
Year: 2023, Volume: 83, Issue: 6, Pages: 1-15 |
| ISSN: | 1434-6052 |
| DOI: | 10.1140/epjc/s10052-023-11512-z |
| Online Access: | Verlag, lizenzpflichtig, Volltext: https://doi.org/10.1140/epjc/s10052-023-11512-z
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| Author Notes: | XENON Collaboration |
| Summary: | A low-energy electronic recoil calibration of XENON1T, a dual-phase xenon time projection chamber, with an internal 37 Ar source was performed. This calibration source features a 35-day half-life and provides two monoenergetic lines at 2.82 keV and 0.27 keV. The photon yield and electron yield at 2.82 keV are measured to be (32.3 ± 0.3) photons/keV and (40.6 ± 0.5) electrons/keV, respectively, in agreement with other measurements and with NEST predictions. The electron yield at 0.27 keV is also measured and it is (68.0+6.3 −3.7 ) electrons/keV. The 37 Ar calibration confirms that the detector is well-understood in the energy region close to the detection threshold, with the 2.82 keV line reconstructed at (2.83 ± 0.02) keV, which further validates the model used to interpret the low-energy electronic recoil excess previously reported by XENON1T. The ability to efficiently remove argon with cryogenic distillation after the calibration proves that 37 Ar can be considered as a regular calibration source for multi-tonne xenon detectors. |
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| Item Description: | Im Text ist "37" hochgestellt XENON Collaboration: E. Aprile, M. Lindner, T. Marrodán Undagoitia, A. Terliuk [und viele weitere] Gesehen am 05.02.2024 |
| Physical Description: | Online Resource |
| ISSN: | 1434-6052 |
| DOI: | 10.1140/epjc/s10052-023-11512-z |