Anodization-free fabrication process for high-quality cross-type Josephson tunnel junctions based on a Nb/Al-AlOx/Nb trilayer
Josephson tunnel junctions form the basis for various superconductor electronic devices. For this reason, enormous efforts are routinely taken to establish and later on maintain a scalable and reproducible wafer-scale manufacturing process for high-quality Josephson junctions. Here, we present an an...
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| Main Authors: | , , |
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| Format: | Article (Journal) |
| Language: | English |
| Published: |
8 July 2024
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| In: |
Superconductor science and technology
Year: 2024, Volume: 37, Issue: 8, Pages: 1-12 |
| ISSN: | 1361-6668 |
| DOI: | 10.1088/1361-6668/ad59cf |
| Online Access: | Verlag, kostenfrei, Volltext: https://doi.org/10.1088/1361-6668/ad59cf Verlag, kostenfrei, Volltext: https://dx.doi.org/10.1088/1361-6668/ad59cf 
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| Author Notes: | F Adam, C Enss and S Kempf |
| Summary: | Josephson tunnel junctions form the basis for various superconductor electronic devices. For this reason, enormous efforts are routinely taken to establish and later on maintain a scalable and reproducible wafer-scale manufacturing process for high-quality Josephson junctions. Here, we present an anodization-free fabrication process for Nb/Al-AlO x /Nb cross-type Josephson junctions that requires only a small number of process steps and that is in general intrinsically compatible with wafer-scale fabrication. We show that the fabricated junctions are of very high quality and, compared to other junction types, exhibit not only a significantly reduced capacitance but also an almost rectangular critical current density profile. Our process hence enables the usage of low capacitance Josephson junctions for superconductor electronic devices such as ultra-low noise dc-superconducting quantum interference devices (SQUIDs), microwave SQUID multiplexers based on non-hysteretic rf-SQUIDs and RFSQ circuits. |
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| Item Description: | Gesehen am 19.12.2024 Im Titel ist der Buchstabe "x" tiefgestellt |
| Physical Description: | Online Resource |
| ISSN: | 1361-6668 |
| DOI: | 10.1088/1361-6668/ad59cf |