Confocal photoluminescence mapping of diamond photonic crystal cavity modes for the silicon vacancy center

Diamond photonic crystal cavities offer exceptional properties for interfacing color centers in diamond to integrated photonic circuits. Leveraging Purcell enhancement of the color centers’ emission into the zero-phonon line, the development of high quality, low mode volume single-crystal diamond re...

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Autori principali: Jin, Lin (Autore) , Ulanov, Mark (Autore) , Dietel, Stefan (Autore) , Kazak, Lev (Autore) , Lang, Nicola (Autore) , Knittel, Peter (Autore) , Jelezko, Fedor (Autore) , Pernice, Wolfram (Autore)
Natura: Article (Journal)
Lingua:inglese
Pubblicazione: 6 Apr 2026
In: Optics express
Year: 2026, Volume: 34, Fascicolo: 7, Pages: 12493-12506
ISSN:1094-4087
DOI:10.1364/OE.585152
Accesso online:Resolving-System, kostenfrei, Volltext: https://doi.org/10.1364/OE.585152
Verlag, kostenfrei, Volltext: https://opg.optica.org/oe/abstract.cfm?uri=oe-34-7-12493
Testo
Note sull'autore:Lin Jin, Mark Ulanov, Stefan Dietel, Lev Kazak, Nicola Lang, Peter Knittel, Fedor Jelezko, and Wolfram Pernice
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Riassunto:Diamond photonic crystal cavities offer exceptional properties for interfacing color centers in diamond to integrated photonic circuits. Leveraging Purcell enhancement of the color centers’ emission into the zero-phonon line, the development of high quality, low mode volume single-crystal diamond resonators remains one of the key challenges for building diamond quantum networks. In this paper, we present both a robust, versatile photonic crystal design as well as a scalable fabrication process realizing suspended nanobeam cavities. Measurements of confocal microscopy with broadband excitation yield quality factors of more than 5000. We further demonstrate a fast and facile characterization of our structures based on confocal photoluminescence imaging. This method not only provides a more detailed look at the higher order modes within diamond nanobeam resonators but also serves as a non-destructive diagnostic of the modes’ susceptibility to fabrication imperfections, providing critical feedback for scalable, high-yield integrated quantum photonic device development.
Descrizione del documento:Gesehen am 24.06.2026
Descrizione fisica:Online Resource
ISSN:1094-4087
DOI:10.1364/OE.585152