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IEEE transactions on device and materials reliability

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Bibliographic Details
Corporate Author: Institute of Electrical and Electronics Engineers (Author)
Format: Edited Volume Journal
Language:English
Published: New York, NY IEEE 2001-
Volumes / Articles: Show Volumes / Articles.
ISSN:1558-2574
1530-4388
Subjects:
Zeitschrift
Online-Ressource
Zuverlässigkeit
Elektronik
Online Access:Frontdoor-Url: https://ezb.ur.de/?2061445-7
Verlag: https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7298
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Description
Published:1.2001 -
Item Description:Gesehen am 05.12.06
Physical Description:Online Resource
ISSN:1558-2574
1530-4388

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