Digital pixel test structures implemented in a 65 nm CMOS process
by Aglieri Rinella, Gianluca (Author)
, Andronic, Anton (Author)
, Antonelli, Matias (Author)
, Aresti, Mauro (Author)
, Baccomi, Roberto (Author)
, Becht, Pascal (Author)
, Beole, Stefania (Author)
, Braach, Justus (Author)
, Buckland, Matthew Daniel (Author)
, Buschmann, Eric (Author)
, Camerini, Paolo (Author)
, Carnesecchi, Francesca (Author)
, Cecconi, Leonardo (Author)
, Charbon, Edoardo (Author)
, Contin, Giacomo (Author)
, Dannheim, Dominik (Author)
, de Melo, Joao (Author)
, Deng, Wenjing (Author)
, di Mauro, Antonello (Author)
, Hasenbichler, Jan (Author)
, Hillemanns, Hartmut (Author)
, Hong, Geun Hee (Author)
, Isakov, Artem (Author)
, Junique, Antoine (Author)
, Kluge, Alex (Author)
, Kotliarov, Artem (Author)
, Křížek, Filip (Author)
, Lautner, Lukas (Author)
, Mager, Magnus (Author)
, Marras, Davide (Author)
, Martinengo, Paolo (Author)
, Masciocchi, Silvia (Author)
, Menzel, Marius Wilm (Author)
, Munker, Magdalena (Author)
, Piro, Francesco (Author)
, Rachevski, Alexandre (Author)
, Rebane, Karoliina (Author)
, Reidt, Felix (Author)
, Russo, Roberto (Author)
, Sanna, Isabella (Author)
, Sarritzu, Valerio (Author)
, Senyukov, Serhiy (Author)
, Snoeys, Walter (Author)
, Sonneveld, Jory (Author)
, Šuljić, Miljenko (Author)
, Svihra, Peter (Author)
, Tiltmann, Nicolas (Author)
, Usai, Gianluca (Author)
, Van Beelen, Jacob Bastiaan (Author)
, Vassilev, Mirella Dimitrova (Author)
, Vernieri, Caterina (Author)
, Villani, Anna (Author)
,
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