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    Digital pixel test structures implemented in a 65 nm CMOS process by Aglieri Rinella, Gianluca (Author) , Andronic, Anton (Author) , Antonelli, Matias (Author) , Aresti, Mauro (Author) , Baccomi, Roberto (Author) , Becht, Pascal (Author) , Beole, Stefania (Author) , Braach, Justus (Author) , Buckland, Matthew Daniel (Author) , Buschmann, Eric (Author) , Camerini, Paolo (Author) , Carnesecchi, Francesca (Author) , Cecconi, Leonardo (Author) , Charbon, Edoardo (Author) , Contin, Giacomo (Author) , Dannheim, Dominik (Author) , de Melo, Joao (Author) , Deng, Wenjing (Author) , di Mauro, Antonello (Author) , Hasenbichler, Jan (Author) , Hillemanns, Hartmut (Author) , Hong, Geun Hee (Author) , Isakov, Artem (Author) , Junique, Antoine (Author) , Kluge, Alex (Author) , Kotliarov, Artem (Author) , Křížek, Filip (Author) , Lautner, Lukas (Author) , Mager, Magnus (Author) , Marras, Davide (Author) , Martinengo, Paolo (Author) , Masciocchi, Silvia (Author) , Menzel, Marius Wilm (Author) , Munker, Magdalena (Author) , Piro, Francesco (Author) , Rachevski, Alexandre (Author) , Rebane, Karoliina (Author) , Reidt, Felix (Author) , Russo, Roberto (Author) , Sanna, Isabella (Author) , Sarritzu, Valerio (Author) , Senyukov, Serhiy (Author) , Snoeys, Walter (Author) , Sonneveld, Jory (Author) , Šuljić, Miljenko (Author) , Svihra, Peter (Author) , Tiltmann, Nicolas (Author) , Usai, Gianluca (Author) , Van Beelen, Jacob Bastiaan (Author) , Vassilev, Mirella Dimitrova (Author) , Vernieri, Caterina (Author) , Villani, Anna (Author) ,


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